Yihai He

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Yihai He is a professor at the School of Reliability and Systems Engineering, Beihang University, People's Republic of China. He has been involved in the quality and reliability engineering for about 20 years. His main research interests are reliability in manufacturing, advanced quality engineering techniques and intelligent manufacturing system, he has published over 100 papers on international journals and conferences including lEEE Transactions on Reliability, Reliability Engineering & System safety and etc.

Wei Dai is an associate professor at the School of Reliability and Systems Engineering, Beihang University, People's Republic of China. He received the Ph.D degree in manufacturing and systems engineering from Beihang University in 2010. His main research interests are intelligent manufacturing process reliability, quality data analytics and reliability manufacturing technology, he has published over 60 papers on international journals and conferences including Computers & Industrial engineering, International Journal of Computer Integrated Manufacturing and etc.

Jun Ai, Professor, Vice Dean of School of Reliability and Systems Engineering, Beihang University, China, Deputy Director of Reliability Engineering Technology Research Center, Chair of IEEE Reliability Society Beijing Chapter, Senior Member of IEEE and CCF. His main research field are in software and intelligent system reliability and safety, including: Software failure mechanism and defect prediction, software system intelligent testing, intelligent system/software reliability and safety evaluation, etc. He published more than 60 papers, 3 monograph books, authorized more than 30 patents, headed many research projects in the field of software reliability.

Weifang Zhang, Professor, member of the Academic Committee of the School of Reliability and Systems Engineering at Beihang University. His main research directions include material and structural damage, structural safety and health monitoring, life prediction, accident investigation, and failure analysis. He has published over 200 academic papers, authorized more than 20 national invention patents, and has authored, edited, or translated 6 monographs.