Handbook of Nanoscopy E-Book

• Herausgeber: Wiley-VCH
• Kategorie: Wissenschaft und neue Technologien
• Sprache: Englisch

Seitenzahl: 2527

Veröffentlichungsjahr: 2012

Beschreibung

This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical
to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going
on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,
alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between
methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and
engineers, as well as graduate students and their lecturers.

Leseprobe

Table of Contents

Further Reading

Title Page

Copyright

Contents to Volume 1

Preface

List of Contributors

The Past, the Present, and the Future of Nanoscopy

The Past

The Present and the Future

Acknowledgments

References

Part I: Methods

Chapter 1: Transmission Electron Microscopy

1.1 Introduction

1.2 The Instrument

1.3 Imaging and Diffraction Modes

1.4 Dynamical Diffraction Theory

References

Chapter 2: Atomic Resolution Electron Microscopy

2.1 Introduction

2.2 Principles of Linear Image Formation

2.3 Imaging in the Electron Microscope

2.4 Experimental HREM

2.5 Quantitative HREM

2.6 Appendix 2.A: Interaction of the Electron with a Thin Object

2.7 Appendix 2.B: Multislice Method

2.8 Appendix 2.C: Quantum Mechanical Approach

References

Chapter 3: Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration

3.1 Introduction

3.2 The Principles of Atomic-Resolution Imaging

3.3 Inversion of the Imaging Process

3.4 Case Study: SrTiO3

3.5 Practical Examples of Application of NCSI Imaging

References

Chapter 4: Z-Contrast Imaging

4.1 Recent Progress

4.2 Introduction to the Instrument

4.3 Imaging in the STEM

4.4 Future Outlook

Acknowledgments

References

Chapter 5: Electron Holography

5.1 General Idea

5.2 Image-Plane Off-Axis Holography Using the Electron Biprism

5.3 Properties of the Reconstructed Wave

5.4 Holographic Investigations

5.5 Special Techniques

5.6 Summary

Acknowledgments

References

Books

Articles

Basics

Method

Interpretation

Inverse Problem

Applications

Electric Potentials

Semiconductors

Li-Ion Batteries

Holographic Tomography

Magnetic

Atomic Resolution

Chapter 6: Lorentz Microscopy and Electron Holography of Magnetic Materials

6.1 Introduction

6.2 Lorentz Microscopy

6.3 Off-Axis Electron Holography

6.4 Discussion and Conclusions

Acknowledgments

References

Chapter 7: Electron Tomography

7.1 History and Background

7.2 Theory of Tomography

7.3 Electron Tomography, Missing Wedge, and Imaging Modes

7.4 STEM Tomography and Applications

7.5 Hollow-Cone DF Tomography

7.6 Diffraction Contrast Tomography

7.7 Electron Holographic Tomography

7.8 Inelastic Electron Tomography

7.9 Advanced Reconstruction Techniques

7.10 Quantification and Atomic Resolution Tomography

Acknowledgments

References

Chapter 8: Statistical Parameter Estimation Theory – A Tool for Quantitative Electron Microscopy

8.1 Introduction

8.2 Methodology

8.3 Electron Microscopy Applications

8.4 Conclusions

Acknowledgments

References

Chapter 9: Dynamic Transmission Electron Microscopy

9.1 Introduction

9.2 Time-Resolved Studies Using Electrons

9.3 Building a DTEM

9.4 Applications of DTEM

9.5 Future Developments for DTEM

9.6 Conclusions

Acknowledgments

References

Chapter 10: Transmission Electron Microscopy as Nanolab

10.1 TEM and Measuring the Electrical Properties

10.2 TEM with MEMS-Based Heaters

10.3 TEM with Gas Nanoreactors

10.4 TEM with Liquid Nanoreactors

10.5 TEM and Measuring Optical Properties

10.6 Sample Preparation for Nanolab Experiments

References

Chapter 11: Atomic-Resolution Environmental Transmission Electron Microscopy

11.1 Introduction

11.2 Atomic-Resolution ETEM

11.3 Development of Atomic-Resolution ETEM

11.4 Experimental Procedures

11.5 Applications with Examples

11.6 Nanoparticles and Catalytic Materials

11.7 Oxides

11.8 In situ Atomic Scale Twinning Transformations in Metal Carbides

11.9 Dynamic Electron Energy Loss Spectroscopy

11.10 Technological Benefits of Atomic-Resolution ETEM

11.11 Other Advances

11.12 Reactions in the Liquid Phase

11.13 In situ Studies with Aberration Correction

11.14 Examples and Discussion

11.15 Applications to Biofuels

11.16 Conclusions

Acknowledgments

References

Chapter 12: Speckles in Images and Diffraction Patterns

12.1 Introduction

12.2 What Is Speckle?

12.3 What Causes Speckle?

12.4 Diffuse Scattering

12.5 From Bragg Reflections to Speckle

12.6 Coherence

12.7 Fluctuation Electron Microscopy

12.8 Variance versus Mean

12.9 Speckle Statistics

12.10 Possible Future Directions for Electron Speckle Analysis

References

Chapter 13: Coherent Electron Diffractive Imaging

13.1 Introduction

13.2 Coherent Nanoarea Electron Diffraction

13.3 The Noncrystallographic Phase Problem

13.4 Coherent Diffractive Imaging of Finite Objects

13.5 Phasing Experimental Diffraction Pattern

13.6 Conclusions

Acknowledgments

References

Chapter 14: Sample Preparation Techniques for Transmission Electron Microscopy

14.1 Introduction

14.2 Indirect Preparation Methods

14.3 Direct Preparation Methods

14.4 Summary

Acknowledgments

References

Chapter 15: Scanning Probe Microscopy – History, Background, and State of the Art

15.1 Introduction

15.2 Detecting Evanescent Waves by Near-Field Microscopy: Scanning Tunneling Microscopy

15.3 Interaction of Tip–Sample Electrons Detected by Scanning Near-Field Optical Microscopy and Atomic Force Microscopy

15.4 Methods for the Detection of Electric/Electronic Sample Properties

15.5 Methods for the Detection of Electromechanical and Thermoelastic Quantities

15.6 Advanced SFM/SEM Microscopy

Acknowledgments

References

Chapter 16: Scanning Probe Microscopy – Forces and Currents in the Nanoscale World

16.1 Introduction

16.2 Scanning Probe Microscopy – the Science of Localized Probes

16.3 Scanning Tunneling Microscopy and Related Techniques

16.4 Force-Based SPM Measurements

16.5 Voltage Modulation SPMs

16.6 Current Measurements in SPM

16.7 Emergent SPM Methods

16.8 Manipulation of Matter by SPM

16.9 Perspectives

Acknowledgments

References

Chapter 17: Scanning Beam Methods

17.1 Scanning Microscopy

17.2 Conclusions

References

Chapter 18: Fundamentals of the Focused Ion Beam System

18.1 Focused Ion Beam Principles

18.2 FIB Techniques

Acknowledgments

References

Further Reading

Contents to Volume 2

Chapter 19: Low-Energy Electron Microscopy

19.1 Introduction

19.2 Theoretical Foundations

19.3 Instrumentation

19.4 Areas of Application

19.5 Discussion

19.6 Concluding Remarks

References

Chapter 20: Spin-Polarized Low-Energy Electron Microscopy

20.1 Introduction

20.2 Theoretical Foundations

20.3 Instrumentation

20.4 Areas of Application

20.5 Discussion

20.6 Concluding Remarks

References

Chapter 21: Imaging Secondary Ion Mass Spectroscopy

21.1 Fundamentals

21.2 SIMS Techniques

21.3 Biological SIMS

21.4 Conclusions

References

Chapter 22: Soft X-Ray Imaging and Spectromicroscopy

22.1 Introduction

22.2 Experimental Techniques

22.3 Data Analysis Methods

22.4 Selected Applications

22.5 Future Outlook and Summary

Acknowledgments

References

Chapter 23: Atom Probe Tomography: Principle and Applications

23.1 Introduction

23.2 Basic Principles

23.3 Field Ion Microscopy

23.4 Atom Probe Tomography

23.5 Conclusion

References

Chapter 24: Signal and Noise Maximum Likelihood Estimation in MRI

24.1 Probability Density Functions in MRI

24.2 Signal Amplitude Estimation

24.3 Noise Variance Estimation

24.4 Conclusions

References

Chapter 25: 3-D Surface Reconstruction from StereoScanning Electron Microscopy Images

25.1 Introduction

25.2 Matching Stereo Images

25.3 Conclusions

Acknowledgments

References

Further Reading

Part II: Applications

Chapter 26: Nanoparticles

26.1 Introduction

26.2 Imaging Nanoparticles

26.3 Electron Tomography of Nanoparticles

26.4 Nanoanalytical Characterization of Nanoparticles

26.5 In situ TEM Characterization of Nanoparticles

References

Chapter 27: Nanowires and Nanotubes

27.1 Introduction

27.2 Structures of Nanowires and Nanotubes

27.3 Defects in Nanowires

27.4 In situ Observation of the Growth Process of Nanowires and Nanotubes

27.5 In situ Mechanical Properties of Nanotubes and Nanowires

27.6 In situ Electric Transport Property of Carbon Nanotubes

27.7 In situ TEM Investigation of Electrochemical Properties of Nanowires

27.8 Summary

References

Chapter 28: Carbon Nanoforms

28.1 Imaging Carbon Nanoforms Using Conventional Electron Microscopy

28.2 Analysis of Carbon Nanoforms Using Aberration-Corrected Electron Microscopes

28.3 Ultrafast Electron Microscopy

28.4 Scanning Tunneling Microscopy (STM)

28.5 Scanning Photocurrent Microscopy (SPCM)

28.6 X-Ray Electrostatic Force Microscopy (X-EFM)

28.7 Atomic Force Microscopy

28.8 Scanning Near-Field Optical Microscope

28.9 Tip-Enhanced Raman and Confocal Microscopy

28.10 Tip-Enhanced Photoluminescence Microscopy

28.11 Fluorescence Quenching Microscopy

28.12 Fluorescence Microscopy

28.13 Single-Shot Extreme Ultraviolet Laser Imaging

28.14 Nanoscale Soft X-Ray Imaging

28.15 Scanning Photoelectron Microscopy

Acknowledgments

References

Chapter 29: Metals and Alloys

29.1 Formation of Nanoscale Deformation Twins by Shockley Partial Dislocation Passage

29.2 Minimal Strain at Austenite–Martensite Interface in Ti-Ni-Pd

29.3 Atomic Structure of Ni4Ti3 Precipitates in Ni-Ti

29.4 Ni-Ti Matrix Deformation and Concentration Gradients in the Vicinity of Ni4Ti3 Precipitates

29.5 Elastic Constant Measurements of Ni4Ti3 Precipitates

29.6 New APB-Like Defect in Ti-Pd Martensite Determined by HRSTEM

29.7 Strain Effects in Metallic Nanobeams

29.8 Adiabatic Shear Bands in Ti6Al4V

29.9 Electron Tomography

29.10 The Ultimate Resolution

Acknowledgments

References

Chapter 30:In situ Transmission Electron Microscopy on Metals

30.1 Introduction

30.2 In situ TEM Experiments

30.3 Grain Boundary Dislocation Dynamics Metals

30.4 In situ TEM Tensile Experiments

30.5 In situ TEM Compression Experiments

30.6 Conclusions

Acknowledgments

References

Chapter 31: Semiconductors and Semiconducting Devices

31.1 Introduction

31.2 Nanoscopic Applications on Silicon-Based Semiconductor Devices

31.3 Conclusions

Acknowledgments

References

Chapter 32: Complex Oxide Materials

32.1 Introduction

32.2 Aberration-Corrected Spectrum Imaging in the STEM

32.3 Imaging of Oxygen Lattice Distortions in Perovskites and Oxide Thin Films and Interfaces

32.4 Atomic-Resolution Effects in the Fine Structure–Further Insights into Oxide Interface Properties

32.5 Applications of Ionic Conductors: Studies of Colossal Ionic Conductivity in Oxide Superlattices

32.6 Applications of Cobaltites: Spin-State Mapping with Atomic Resolution

32.7 Summary

Acknowledgments

References

Chapter 33: Application of Transmission Electron Microscopy in the Research of Inorganic Photovoltaic Materials

33.1 Introduction

33.2 Experimental

33.3 Atomic Structure and Electronic Properties of c-Si/a-Si:H Heterointerfaces

33.4 Interfaces and Defects in CdTe Solar Cells

33.5 Influences of Oxygen on Interdiffusion at CdS/CdTe Heterojunctions

33.6 Microstructure Evolution of Cu(In,Ga)Se2 Films from Cu Rich to In Rich

33.7 Microstructure of Surface Layers in Cu(In,Ga)Se2 Thin Films

33.8 Chemical Fluctuation-Induced Nanodomains in Cu(In,Ga)Se2 Films

33.9 Conclusions and Future Directions

Acknowledgment

References

Chapter 34: Polymers

34.1 Foreword

34.2 A Brief Introduction on Printable Solar Cells

34.3 Morphology Requirements of Photoactive Layers in PSCs

34.4 Our Characterization Toolbox

34.5 How It All Started: First Morphology Studies

34.6 Contrast Creation in Purely Carbon-Based BHJ Photoactive Layers

34.7 Nanoscale Volume Information: Electron Tomography of PSCs

34.8 One Example of Electron Tomographic Investigation: P3HT/PCBM

34.9 Quantification of Volume Data

34.10 Outlook and Concluding Remarks

Acknowledgment

References

Chapter 35: Ferroic and Multiferroic Materials

35.1 Multiferroicity

35.2 Ferroic Domain Patterns and Their Microscopical Observation

35.3 The Internal Structure of Domain Walls

35.4 Domain Structures Related to Amorphization

35.5 Dynamical Properties of Domain Boundaries

35.6 Conclusion

References

Chapter 36: Three-Dimensional Imaging of Biomaterials with Electron Tomography

36.1 Introduction

36.2 Biological Tomographic Techniques

36.3 Examples of Electron Tomography Biomaterials

36.4 Outlook

References

Chapter 37: Small Organic Molecules and Higher Homologs

37.1 Introduction

37.2 Optical Microscopy

37.3 Scanning Electron Microscopy–SEM

37.4 Atomic Force and Scanning Tunneling Microscopy (AFM and STM)

37.5 Transmission Electron Microscopy (TEM)

37.6 Summary

References

Index

Further Reading

Ohser, J. Schladitz, K.

3D Images of Materials Structures

Processing and Analysis

2009

Hardcover

ISBN: 978-3-527-31203-0

Codd, S. L., Seymour, J. D. (eds.)

Magnetic Resonance Microscopy

Spatially Resolved NMR Techniques and Applications

2009

Hardcover

ISBN: 978-3-527-32008-0

Maev, R. G.

Acoustic Microscopy

Fundamentals and Applications

2008

Hardcover

ISBN: 978-3-527-40744-6

Fukumura, H., Irie, M., Iwasawa, Y., Masuhara, H., Uosaki, K. (eds.)

Molecular Nano Dynamics

Vol. I: Spectroscopic Methods and Nanostructures/Vol. II: Active Surfaces, Single Crystals and Single Biocells

2009

Hardcover

ISBN: 978-3-527-32017-2

Roters, F., Eisenlohr, P. Bieler, T. R., Raabe, D.

Crystal Plasticity Finite Element Methods

in Materials Science and Engineering

2010

Hardcover

ISBN: 978-3-527-32447-7

Guo, J. (ed.)

X-Rays in Nanoscience

Spectroscopy, Spectromicroscopy, and Scattering Techniques

2010

Hardcover

ISBN: 978-3-527-32288-6

Tsukruk, V., Singamaneni, S.

Scanning Probe Interrogation of Soft Matter

2012

Hardcover

ISBN: 978-3-527-32743-0

The Editors

Prof. Gustaaf Van Tendeloo

Univ. of Antwerp (RUCA)

EMAT

Groenenborgerlaan 171

2020 Antwerpe

Belgium

Prof. Dirk Van Dyck

Univ. of Antwerp (RUCA)

EMAT

Groenenborgerlaan 171

2020 Antwerp

Belgium

Prof. Dr. Stephen J. Pennycook

Oak Ridge National Lab.

Condensed Matter Science Div.

Oak Ridge, TN 37831-6030

USA

All books published by Wiley-VCH are carefully produced. Nevertheless, authors, editors, and publisher do not warrant the information contained in these books, including this book, to be free of errors. Readers are advised to keep in mind that statements, data, illustrations, procedural details or other items may inadvertently be inaccurate.

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The Deutsche Nationalbibliothek lists this publication in the Deutsche Nationalbibliografie; detailed bibliographic data are available on the Internet at <http://dnb.d-nb.de>.

© 2012 Wiley-VCH Verlag & Co. KGaA, Boschstr. 12, 69469 Weinheim, Germany

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Print ISBN: 978-3-527-31706-6

ePDF ISBN: 978-3-527-64188-8

oBook ISBN: 978-3-527-64186-4

ePub ISBN: 978-3-527-64187-1

mobi ISBN: 978-3-527-64189-5

Contents to Volume 1

Preface

Since the edition of the previous “Handbook of Microscopy” in 1997 the world of microscopy has gone through a significant transition.

In electron microscopy the introduction of aberration correctors has pushed the resolution down to the sub-Angstrom regime, detectors are able to detect single electrons, spectrometers are able to record spectra from single atoms. Moreover the object space is increased which allows to integrate these techniques in the same instrument under full computer support without compromising on the performance. Thus apart from the increased resolution from microscopy to nanoscopy, even towards picoscopy, the EM is gradually transforming from an imaging device into a true nanoscale laboratory that delivers reliable quantitative data on the nanoscale close to the physical and technical limits. In parallel, scanning probe methods have undergone a similar evolution towards increased functionality, flexibility and integration.

As a consequence the whole field of microscopy is gradually shifting from the instrument to the application, from describing to measuring and to understanding the structure/property relations, from nanoscopy to nanology.

But these instruments will need a different generation of nanoscopists who need not only to master the increased flexibility and multifunctionality of the instruments, but to choose and combine the experimental possibilities to fit the material problem to be investigated.

It is the purpose of this new edition of the “Handbook of Nanoscopy” to provide an ideal reference base of knowledge for the future user.

Volume 1 elaborates on the basic principles underlying the different nanoscopical methods with a critical analysis of the merits, drawbacks and future prospects. Volume 2 focuses on a broad category of materials from the viewpoint of how the different nanoscopical measurements can contribute to solving materials structures and problems.

The handbook is written in a very readable style at a level of a general audience. Whenever relevant for deepening the knowledge, proper references are given.

Gustaaf van Tendeloo, Dirk van Dyck, and Stephen J. Pennycook

List of Contributors

Mongi Abidi

The University of Tennessee

Min H. Kao

Department of Electrical Engineering and Computer Science

Imaging Robotics and Intelligent Systems (IRIS) Lab

209 Ferris Hall

Knoxville

TN 37996-2100

USA

Ludwig Josef Balk

Bergische Universitt Wuppertal

Fachbereich Elektronik

Informationstechnik

Medientechnik

Lehrstuhl fr Elektronische Bauelemente

Rainer-Gruenter-Str. 21

42119 Wuppertal

Germany

Sara Bals

University of Antwerp

Department of Physics

EMAT

Groenenborgerlaan 171

2020 Antwerp

Belgium

Montserrat Brcena

Leiden University Medical Center

Department of Molecular Cell Biology

Section Electron Microscopy

Einthovenweg 20

2333 ZC

The Netherlands

Juri Barthel

Forschungszentrum Jlich GmbH

Peter Grnberg Institute and Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons

D-52425 Jlich

Germany

Ernst Bauer

Arizona State University

Department of Physics

Tempe

AZ 85287-1504

USA

Marco Beleggia

Technical University of Denmark

Center for Electron Nanoscopy

DK-2800 Kongens Lyngby

Denmark

Hugo Bender

Imec

Kapeldreef 75

Leuven 3001

Belgium

Carla Bittencourt

University of Antwerp

EMAT

Groenenborgerlaan 171

B-2020 Antwerp

Belgium

Albina Y. Borisevich

Oak Ridge National Laboratory

Materials Science and Technology Division

Oak Ridge

TN 37831-6071

USA

Edward D. Boyes

The University of York

The York JEOL Nanocentre

Departments of Physics

Helix House

Heslington

York, YO10 5BR

UK

and

The University of York

The York JEOL Nanocentre

Department of Electronics

Helix House

Heslington

York, YO10 5BR

UK

Nigel D. Browning

Lawrence Livermore National Laboratory

Condensed Matter and Materials Division

Physical and Life Sciences Directorate

7000 East Avenue

Livermore

CA 94550

USA

and

University of California-Davis

Department of Chemical Engineering and Materials Science

One Shields Ave

Davis, CA 95616

USA

and

University of California-Davis

Department of Molecular and Cellular Biology

One Shields Ave

Davis, CA 95616

USA

and

Pacific Northwest National Laboratory

902 Battelle Boulevard

Richland

WA 99352

USA

Jos Calvino

Facultad de Ciencias de la

Universidad de Cdiz

Departamento de Ciencia de los Materiales e Ingeniera Metalrgica y Qumica Inorgnica

Campus Rio San Pedro

Puerto Real

11510-Cdiz

Spain

Geoffrey H. Campbell

Lawrence Livermore National Laboratory

Condensed Matter and Materials Division

Physical and Life Sciences Directorate

7000 East Avenue

Livermore

CA 94550

USA

Frederic Danoix

Universit de Rouen

Groupe de Physique des

Matriaux, UMR CNRS 6634

Site universitaire du Madrillet

Saint Etienne du Rouvray

76801

France

Juan Jos Delgado

Facultad de Ciencias de la

Universidad de Cdiz

Departamento de Ciencia de los Materiales e Ingeniera Metalrgica y Qumica Inorgnica

Campus Rio San Pedro

Puerto Real

11510-Cdiz

Spain

Marc De Graef

Carnegie Mellon University

Materials Science and Engineering Department

5000 Forbes Avenue

Pittsburgh

PA 15213-3890

USA

J.Th.M. De Hosson

University of Groningen

Department of Applied Physics

Zernike Institute for Advanced Materials and Materials Innovation Institute

Nijenborgh 4

9747 AG Groningen

The Netherlands

Yong Ding

School of Materials Science and Engineering

Georgia Institute of Technology

Atlanta

GA 30332-0245

USA

Rafal E. Dunin-Borkowski

Fraunhofer Institute for Solar Energy Systems ISE

Peter Grnberg Institute and Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons