Table of Contents
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PREFACE
List of Contributors
Advancements in GaN Technologies: Power, RF, Digital and Quantum Applications
Abstract
Introduction
Characteristics of GaN:
Motivation for the Present Research Work
Review of GaN-Based Devices
N-Polarity GaN/InN/GaN/In0.9Al0.1N Heterostructure E-Mode HfO2 Insulated MIS-HEMTs
Boron-Doped GaN Gate Cap Layer in a Double Heterostructure (DH) HEMTs for Full-Bridge Inverter Circuit.
Full-Bridge Inverter Circuit
Conclusion
References
GaN-Based Integrated Optical Devices for Wide-Scenario Sensing Applications
Abstract
INTRODUCTION
SENSING MECHANISMS OF GAN-BASED INTEGRATED OPTICAL DEVICES
GAN-BASED INTEGRATED DEVICES FOR PROXIMITY SENSING
Proximity Sensor
Airflow Sensor
Viscosity Sensor
GAN-BASED INTEGRATED DEVICES FOR REFRACTIVE INDEX SENSING
Refractive Index Sensor
Force Sensing
Angle Sensor
CHALLENGES AND FUTURE SCOPES
CONCLUSION
REFERENCES
Phosphor-Converted III-Nitride Nanowire White Light-Emitting Diodes
Abstract
Introduction
Luminescence Nanomaterials
Nanowire III-nitride LEDs
Phosphor-converted Nanowire LEDs
Conclusion and Perspectives
References
Effect of Non-Square Potential Profile on Electron Transport Lifetime in AlxGa1-xAs-Based Double Quantum Well Structures
Abstract
Introduction
Theory
Quantum Well Structures
GaAs/AlxGa1-xAs Square Quantum Well
AlxGa1-xAs Non-Square Quantum Wells
Electron Energy Eigenvalues and Eigenfunctions in DQW Structures in the Presence of Fapp
Multisubband Electron Transport Lifetime
Results and Discussion
Double Parabolic Quantum Well (DPQW) Structure
Double V-shaped Quantum Well Structure (DVQW)
Double Semi-Parabolic Quantum Well (DSPQW) Structure
Double Semi-V-Shaped Quantum Well (DSVQW) Structure
Double Square Quantum Well (DSQW) Structure:
Comparison of τ in Square and Non-Square DQW Structures
Conclusion
Reference
A Comprehensive Study on High Electron Mobility Transistors
Abstract
Introduction
Basic Structure of HEMT
Heterojunctions
Equilibrium Band Diagram of Type-I Heterojunction
Electrostatics of a Heterojunction
Principle Operation of HEMTs
Classification of HEMTs
Other III-Nitride HEMTs
Challenges associated with HEMTs
Conclusion
References
Study of DC Characteristics of AlGaN/GaN HEMT and its Compact Models
Abstract
INTRODUCTION
Motivation toward HEMT
Cut-off (Off State)
Linear Region (Triode Region)
Saturation Region (Active Region)
Heterostructure Design
Two-Dimensional Electron Gas (2DEG)
Material Composition
DC Results Analysis of AlGaN/GaN HEMT
Advantages of HEMT over MOSFET
Performance Analysis Using Different HEMT Models
EE Model
Parasitic resistances
Saturated Drain Current
Source and Drain Capacitance
Results
ASM Model
Surface Potential
Drain Current
Access Region Resistance
Gate Current
Results
Mvsg Model
Structure
Logic Device Modelling
Results
Challenges and Future Scopes
Conclusion
References
An Overview of Reliability Issues and Challenges Associated with AlGaN/GaN HEMT
Abstract
INTRODUCTION
Reliability Analysis
Doping with Fe
Doping with Carbon
Challenges and Future Scopes
CONCLUSION
References
Next Generation High-Power Material Ga2O3: Its Properties, Applications, and Challenges
Abstract
INTRODUCTION
PHYSICAL PROPERTIES
Polymorphism
β-Ga2O3 Properties
Crystal Structure
Thermal Properties
Optical Properties
GROWTH AND DEPOSITION METHODS
Chemical Synthesis
Thermal Vaporization and Sublimation
Chemical Vapor Deposition
Molecular Beam Epitaxy
APPLICATIONS
Catalysis
Phosphors and Electroluminescent Devices
Gas Sensors
High Power and High Voltage Devices
Schottky diodes
Field Effect Transistors
DEVICE STRUCTURE AND SIMULATION SETUP
RESULTS AND DISCUSSION
Influence on different RF parameters for different fin widths for JL Ga2O3 FINFET
Impact by varying fin width on different linearity parameters for JL Ga2O3 FINFET
CONCLUSION
REFERENCES
Investigation of the Impact of Different Dielectrics on the Characteristics of AlN/β-Ga2O3 HEMT
Abstract
INTRODUCTION
DEVICE STRUCTURE AND ITS DIMENSIONS
RESULTS AND DISCUSSION
CONCLUSION
References
InAs Raised Buried Oxide SOI-TFET with N-type Si1-xGex Pocket for Low-Power Applications
Abstract
INTRODUCTION
METHODOLOGIES FOR SIMULATING DEVICE STRUCTURE
RESULTS AND DISCUSSION
DC Analysis
RF/Analog Analysis
CONCLUSION
REFERENCES
SiGe Source-Based Epitaxial Layer-Encapsulated TFET and its Application as a Resistive Load Inverter
Abstract
INTRODUCTION
COMPUTATIONAL DETAILS: SETUP AND CALIBRATION
OPTIMIZATION OF DESIGN PARAMETERS
Gate-to-source Overlap Length
Germanium Mole Fraction
Source Doping Concentration
Epitaxial Layer Thickness
Comparison of Architectures
Transient Performance of SiGe Source ETLTFET
CONCLUSION
References
Elimination of the Impact of Trap Charges through Heterodielectric BOX in Nanoribbon FET
Abstract
INTRODUCTION
DEVICE STRUCTURE AND SIMULATION SET-UP
RESULTS AND DISCUSSION
Effect of BOX Thickness Variation
Effect of Temperature Variation
CONCLUSION
ACKNOWLEDGMENT
References
Ge-Channel Nanosheet FinFETs for Nanoscale Mixed Signal Application
Abstract
INTRODUCTION
Nanosheet FinFET Structure
Device Simulation Setup
Results and Discussion
CONCLUSION
References
Recent Trends in FET and HEMT-Based Biosensors for Medical Diagnosis
Abstract
Introduction
Sensors in the Biomedical Field
Biosensor and its Applications
Detection Techniques
Label-based and Label-free Detection
Properties of a Biosensor
Biosensors – Trends and Developments
Biosensors using FET
Biosensors using AlGaAs/GaAs HEMT
Biosensors using AlGaN/GaN HEMT
Conclusion
References
2D Material Tungsten Diselenide (WSe2): Its Properties, Applications, and Challenges
Abstract
INTRODUCTION
Single-layer Materials
Transition Metal Dichalcogenides (TMDs):
Optoelectronics
Catalysis
Sensors
Flexible and Wearable Electronics
Photonics and Quantum Technologies
Biomedical Applications
Evaluation of WSe2
Graphene Replacing Silicon in MOSFET
High Electron Mobility
Low Resistance
Thinness
Stability
Compatibility with Silicon
MoS2 Replacing Graphene in Semiconductor Device
Band Gap
Absorption
Stability
Scalability
Compatibility
Comparison Between Molybdenum Disulfide and Tungsten Diselenide
Advantages of MoS2 over WSe2
Stability
Scalability
Bandgap
Advantages of WSe2 over MoS2
Optical Properties
Carrier Mobility
Spintronics
Structure of WSe2
Properties and Applications of WSe2
Layered Structure
Semiconducting Nature
Strong Photoluminescence
Electrical Conductivity
Mechanical Flexibility
Chemical Stability
Thermal Stability
Quantum Properties
Optical Absorption
Electrical Properties of WSe2
Semiconductor Behaviour
Band Gap Energy
High Carrier Mobility
Anisotropic Conductivity
Field-Effect Transistors (FETs)
Tuneable Carrier Type
Photoconductivity
Thermoelectric Properties
Advantages of WSe2 Compared to other 2D Materials
Direct Band Gap
High Carrier Mobility
Thickness-Dependent Properties
Anisotropic Conductivity
Mechanical Flexibility
Environmental Stability
Strong Light-Matter Interaction
Applications of WSe2
Optoelectronic Devices
Transistors and Integrated Circuits
Flexible Electronics
Sensors
Quantum Technologies
Energy Storage
Catalysis
Device Design and Simulation Analysis
Challenges of WSe2
Scalable Synthesis
Defects and Impurities
Stability
Contact Resistance
Heterogeneity
Integration with Other Materials
Future Scope of WSe2
Electronics and Photonics
Quantum Technologies
Energy Conversion and Storage
Wearable and Flexible Electronics
Biomedical Applications
CONCLUSION
References
Memristors as Prospective Devices for Silicon and Post-Silicon Eras: Theory, Applications and Perspectives
Abstract
INTRODUCTION
Properties of Memristors
Models for Memristors
Linear Ion Drift Model
Non-Linear Ion Drift Model
Simmons Tunnel Barrier Model
TEAM Model
VTEAM Model
Memristors and Applications
Memristor-based Logic
Memristor-based Circuits
Memristor-based Models for Machine Learning
Memristor-driven Neural Networks
Memristor-based Oscillators
Memristive Cryptography
Memristors for CMOS-compatible Logic
Memristor for Neuromorphic Computing
Biomaterial-based Memristors
Memristors for Sensing Applications
Perspectives of Memristors in the Future
CONCLUSION
AUTHORS' CONTRIBUTIONS
References
Nanoelectronic Devices and Applications
Edited by
Trupti Ranjan Lenka
Department of Electronics and Communication Engineering
National Institute of Technology Silchar
Silchar, Assam-788010, India
&
Hieu Pham Trung Nguyen
Department of Electrical and Computer Engineering
Texas Tech University
910 Boston Avenue, Lubbock, Texas-79409, USA
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PREFACE
Nanoelectronic devices play a crucial role in current and future practical applications, including quantum computing, automotive, display, sensing, high-power electronics, and consumer electronics. These emerging applications have their specific, unique requirements and demand integration of functionalities into a single chip with high efficiency, smaller size, lightweight, and high-power handling capability. These research fields have attracted researchers and are of great interest in the photonic and electronic communities.
This book contains 16 chapters, presenting recent advances as well as new directions in emerging nanoelectronic devices and their applications. It covers novel materials systems, band engineering, theoretical calculation, modeling and simulations, fabrication and characterization techniques, and emerging applications of nanoelectronic devices. Several discussions presented in this book are based on current innovations and trends toward the next several years.
Chapter 1 presents an overview of recent innovations and future prospects in III-nitride semiconductor technologies for RF, power, digital and quantum computing applications.
Chapters 2 and 3 report new trends in GaN-based optical devices for sensing and micro-display applications. In Chapter 2, a comprehensive review on GaN-based sensors is presented, and a special focus is on GaN-based integrated optical devices with detailed elucidations on their sensing mechanisms, device fabrication, performance, and applications. Chapter 3 shows current interests in nanophosphors and their utilizations in improving the device performance of InGaN nanowire light-emitting diodes (LEDs). These approaches provide potential solutions for achieving high efficiency micro-LEDs for micro-display, AR/VR headset applications.
Recent studies on the effect of potential profile on the carrier transport in AlGaAs-based double quantum well structures and their applications are explained in Chapter 4. This chapter lists possible approaches for the improved performance of emerging low dimensional semiconductor devices by engineering their band energy structures.
Recent progress in high-electron-mobility transistors (HEMTs) is presented in Chapters 5, 6, and 7. Current developments, general challenges in device fabrication and reliability, and future prospects of HEMTs are also clearly discussed in Chapters 5 and 6. Chapter 7 shows the capabilities of the ADS tool in simulating the characteristics of HEMTs.
A comprehensive review of β-Ga2O3 with details on material properties, growth approaches, and its applications for next-generation high-power electronics is displayed in Chapter 8. This chapter also discusses the potential of this material system for future nanoelectronics. Looking at the different figures of merit for different ultrawide band gap semiconductors of interest, β-Ga2O3 material has the potential for far superior performance than conventional wide band gap semiconductors (GaN and SiC). Chapter 9 presents detailed investigations of the effect of dielectric layers on the characteristics of AlN/β-Ga2O3 HEMTs. These studies provide deep insight into the design and development of HEMTs for high-frequency and high-power electronic devices.
Chapters 10-14 summarize recent studies on field-effect transistors (FETs) adopting different materials and structures. Chapter 10 discusses the device performance based on electrostatic parameters in InAs raised buried Oxide SOI-TFET with n-type SiGe pocket. The tunneling width and the lateral electric field play important roles in the subthreshold swing of the devices. Chapter 11 summarizes current approaches to achieve high-performance ETLTFET compared with its homo-junction counterpart by using SiGe source-based epitaxial layer-encapsulated TFET. Chapter 12 includes important studies for reducing the effect of trap charges on numerous electrical properties in traditional NR-FETs by using heterodielectric BOX nanoribbon FET structures. These studies show important approaches to the design of high-reliability TFET. Chapter 13 discusses a unique configuration of FET using nanosheet FinFET structures. The design, operation, device performance and emerging application of this type of FET are presented in this chapter. The applications of FET and HEMT have been intensively investigated for biosensing applications, including label-based and label-free detection techniques. Chapter 14 presents recent trends in biosensors for medical diagnosis using FETs and HEMTs.
Chapter 15 summarizes current research on the 2-dimensional material Tungsten Diselenide (WSe2) with a special focus on the material properties, device structures, applications, and challenges.
Chapter 16 presents a systematic review of in-demand applications of memristors and memristive semiconductor devices. Memristors show promising applications in neuromorphic and memory-remembering applications. Moreover, memristors are highly promising for the design of signal processors, FPGAs, and sensors. The theory, applications, and future perspectives of memristors for the silicon post-silicon era are clearly discussed.
We would like to take this opportunity to thank all authors for their valuable contributions to this book. We would also like to acknowledge all reviewers of this book for their time and comments.
Trupti Ranjan Lenka
Department of Electronics and Communication Engineering
National Institute of Technology Silchar
Silchar, Assam-788010, India
&Hieu Pham Trung Nguyen
Department of Electrical and Computer Engineering
Texas Tech University
910 Boston Avenue, Lubbock, Texas-79409, USA
List of Contributors
Abdul Naim KhanDepartment of Electronics and Communication Engineering, The LNM Institute of Information Technology, Jaipur, IndiaAshish Kumar SinghChitkara University Institute of Engineering and Technology, Chitkara University, Punjab, IndiaAjit K. SahuDepartment of Electronic Science, Berhampur University, Berhampur, Odisha, IndiaA. MohanbabuSRM Institute of Science and Technology, Ramapuram, ChennaiDeepak Kumar PandaDepartment of ECE, Amrita School of Engineering, Amrita Vishwa, Vidyapeetham, Amaravati Campus, IndiaDinesh Kumar DashDepartment of Electronics and Telecommunication, Parala Maharaja Engineering College, Berhampur, Odisha, 761003, IndiaDeepak Kumar PandaDepartment of ECE, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Amaravati Campus, 522503, Andhra Pradesh, IndiaE. RaghuveeraDepartment of Electronics and Communication Engineering, National Institute of Technology Silchar-788010, Assam, IndiaG. Purnachandra RaoDepartment of Electronics and Communication Engineering, National Institute of Technology Silchar, 788010, Assam, IndiaGajendra KumarDepartment of Molecular Biology, Cell Biology & Biochemistry (MCB), Brown University, USAHieu Pham Trung NguyenDepartment of Electrical and Computer Engineering, Texas Tech University, 910 Boston Avenue, Lubbock, Texas 79409, USAHirakjyoti ChoudhuryDepartment of Electronics and Communication Engineering, Tezpur University, Assam-784028, IndiaHoang-Duy NguyenInstitute of Chemical Techonology, Vietnam Academy of Science and Technology, Hochiminh City-70000, VietnamK. JenaDepartment of Electronics and Communication Engineering, The LNM Institute of Information Technology, Jaipur, IndiaKwai Hei LiSchool of Microelectronics, Southern University of Science and Technology, Shenzhen-518055, ChinaLakshmi Nivas TejaDepartment of Electronics and Communication Engineering, Malaviya National Institute of Technology Jaipur, Rajasthan-302017, IndiaM. Nomitha ReddyDepartment of Electronics and Communication Engineering, NIT Mizoram, Aizawl, 796001, IndiaMeenakshi ChauhanDepartment of Electronics and Communication Engineering, The LNM Institute of Information Technology, Jaipur, IndiaMano Bala Sankar MuthuDepartment of Electrical and Computer Engineering, Texas Tech University, 910 Boston Avenue, Lubbock, Texas 79409, USAM. SureshSchool of Electronics Engineering, VIT Bhopal University, Bhopal, Madhya Pradesh-466114, IndiaNawal TopnoDepartment of Electronics and Telecommunication, Parala Maharaja Engineering College, Berhampur, Odisha, 761003, IndiaNayan M. KakotyDepartment of Electronics and Communication Engineering, Tezpur University, Assam-784028, IndiaNarayan SahooDepartment of Electronic Science, Berhampur University, Berhampur, Odisha, IndiaN. VinodhkumarVel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai, India,P. MurugapandiyanAnil Neerukonda Institute of Technology & Sciences, Visakhapatnam, Andhra Pradesh, India,Rupam GoswamiDepartment of Electronics and Communication Engineering, Tezpur University, Assam-784028, IndiaRaghunandan SwainDepartment of Electronics and Telecommunication, Parala Maharaja Engineering College, Berhampur, Odisha, 761003, IndiaR. Saravana KumarSchool of Electronics Engineering, VIT University, Chennai, IndiaRajesh SahaDepartment of Electronics and Communication Engineering, Malaviya National Institute of Technology Jaipur, Rajasthan-302017, IndiaRashi ChaudharyDepartment of Electronics and Communication Engineering, Malaviya National Institute of Technology Jaipur, Rajasthan-302017, IndiaRadhe Gobinda DebnathDepartment of Electronics and Communication Engineering, National Institute of Technology, Silchar, AssamRaghuvir TomarDepartment of Electronics and Communication Engineering, The LNM Institute of Information Technology, Jaipur, IndiaSatyabrata JitDepartment of Electronics Engineering, Indian Institute of Technology (BHU), Varanasi, IndiaSrimanta BaishyaDepartment of Electronics and Communication Engineering, National Institute of Technology, Silchar, AssamShreyas TiwariDepartment of Electronics and Communication Engineering, Malaviya National Institute of Technology Jaipur, Rajasthan-302017, IndiaSangeeta K. PaloDepartment of Electronic Science, Berhampur University, Berhampur, Odisha, IndiaS. MaheswariPanimalar Engineering College, Chennai, IndiaTrinath SahuCoENSTds, Berhampur University, Berhampur, Odisha, IndiaTanjim RahmanDepartment of Electronics and Communication Engineering, National Institute of Technology Silchar-788010, Assam, IndiaTrupti Ranjan LenkaDepartment of Electronics and Communication Engineering, National Institute of Technology Silchar-788010, Assam, IndiaVydha Pradeep KumarSchool of Electronics Engineering, VIT-AP University, Near Vijayawada, 522501, IndiaXiaoshuai AnSchool of Microelectronics, Southern University of Science and Technology, Shenzhen-518055, China
Advancements in GaN Technologies: Power, RF, Digital and Quantum Applications
A. Mohanbabu1,*,S. Maheswari2,N. Vinodhkumar3,P. Murugapandiyan4,R. Saravana Kumar5
1 SRM Institute of Science and Technology, Ramapuram, Chennai, India
2 Panimalar Engineering College, Chennai, India
3 Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai, India
4 Anil Neerukonda Institute of Technology & Sciences, Visakhapatnam, Andhra Pradesh, India
5 School of Electronics Engineering, VIT University, Chennai, India
Abstract
Quantum well devices based on III-V heterostructures outperform Field Effect Transistors (FETs) by harnessing the exceptional properties of the two-dimensional electron gas (2DEG) in various material interface systems. In high-power electronics, III-V-based Gallium Nitride (GaN) HEMTs can have a great influence on the transport industry, consumer, RADAR, sensing systems, RF/ power electronics, and military systems. On the other hand, the devices made of HEMTs and MIS-HEMTs work in enhancement mode, having very low leakage current, which can conserve energy for more efficient power conversion, microwave/ power transistors and high-speed performance for wireless communication. The existing physics of the well-established AlGaN heterostructure system imposes constraints on the further progress of GaN-based HEMTs. Some of the scopes include: Initially, the semiconductor materials made of SiC, GaN, and AlGaN allow a device that is resistant to severe conditions, such as high-power /voltage-high temperature, to operate due to its effective dielectric constant and has a very good thermal conductivity, which makes this device well-suited for military applications. Secondly, with the urgent need for high-speed internet multimedia communication across the world, high transmission network capacity is required. GaN-based HEMT devices are suitable candidates for achieving high-speed limits, high gain and low noise performance. In conclusion, GaN and related interface materials exhibit chemical stability and act as robust semiconductors, exhibiting remarkable piezoelectric polarization effects that lead to a high-quality 2DEG. Integrating free-standing resonators with functionalized GaN-based 2DEG formation reveals the potential for designing advanced sensors.
Keywords: AlGaN, GaN, SiC, Power devices and switching, III-V materials.
*Corresponding author A. Mohanbabu: SRM Institute of Science and Technology, Ramapuram, Chennai, India; E-mail:
[email protected]References
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