131,99 €
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life * Provides a unique methodological approach to understanding modern measurements * Important methods and devices are presented in a synthetic and easy-to-understand way * Includes end-of-chapter exercises and solutions
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Seitenzahl: 680
Veröffentlichungsjahr: 2015
IEEE Press
445 Hoes Lane
Piscataway, NJ 08854
IEEE Press Editorial Board
Tariq Samad, Editor in Chief
George W. Arnold
Vladimir Lumelsky
Linda Shafer
Dmitry Goldgof
Pui-In Mak
Zidong Wang
Ekram Hossain
Jeffrey Nanzer
MengChu Zhou
Mary Lanzerotti
Ray Perez
George Zobrist
Kenneth Moore, Director of IEEE Book and Information Services (BIS)
Technical Reviewers
Mihaela Albu, Politehnica University of Bucharest, Faculty of El. Engineering
Mary Yeary, University of Oklahoma
Edited by
ALESSANDRO FERRERO DARIO PETRI PAOLO CARBONE MARCANTONIO CATELANI
Copyright © 2015 by The Institute of Electrical and Electronics Engineers, Inc.
Published by John Wiley & Sons, Inc., Hoboken, New Jersey. All rights reserved
Published simultaneously in Canada
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Library of Congress Cataloging-in-Publication Data is available.
ISBN: 978-1-118-17131-8
PREFACE
ACRONYMS
PART I FUNDAMENTALS
CHAPTER 1 MEASUREMENT MODELS AND UNCERTAINTY
1.1 INTRODUCTION
1.2 MEASUREMENT AND METROLOGY
1.3 MEASUREMENT ALONG THE CENTURIES
1.4 MEASUREMENT MODEL
1.5 UNCERTAINTY IN MEASUREMENT
1.6 UNCERTAINTY DEFINITION AND EVALUATION
1.7 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
NOTES
CHAPTER 2 THE SYSTEM OF UNITS AND THE MEASUREMENT STANDARDS
2.1 Introduction
2.2 ROLE OF THE UNIT IN THE MEASUREMENT PROCESS
2.3 IDEAL STRUCTURE OF A UNIT SYSTEM
2.4 EVOLUTION OF THE UNIT DEFINITION
2.5 THE SI SYSTEM OF UNITS
2.6 PERSPECTIVES OF FUTURE SI EVOLUTION
2.7 REALIZATION OF UNITS AND PRIMARY STANDARDS
2.8 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
NOTES
CHAPTER 3 DIGITAL SIGNAL PROCESSING IN MEASUREMENT
3.1 INTRODUCTION
3.2 SAMPLING THEORY
3.3 MEASUREMENT ALGORITHMS FOR PERIODIC SIGNALS
3.4 DIGITAL FILTERS
3.5 MEASURING MULTI-FREQUENCY SIGNALS
3.6 STATISTICAL MEASUREMENT ALGORITHMS
3.7 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
NOTE
CHAPTER 4 AD AND DA CONVERSION
4.1 INTRODUCTION
4.2 SAMPLING
4.3 ANALOG-TO-DIGITAL CONVERTERS
4.4 CRITICAL ADC PARAMETERS
4.5 SAMPLING TECHNIQUES
4.6 DAC
4.7 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
NOTES
CHAPTER 5 BASIC INSTRUMENTS: MULTIMETERS
5.1 INTRODUCTION
5.2 HISTORY
5.3 MAIN CHARACTERISTICS
5.4 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
CHAPTER 6 BASIC INSTRUMENTS: OSCILLOSCOPES
6.1 INTRODUCTION
6.2 TYPES OF WAVEFORMS
6.3 WAVEFORM MEASUREMENTS
6.4 TYPES OF OSCILLOSCOPES
6.5 OSCILLOSCOPE CONTROLS
6.6 MEASUREMENTS
6.7 PERFORMANCE CHARACTERISTICS
6.8 OSCILLOSCOPE PROBES
6.9 USING THE OSCILLOSCOPE
6.10 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
CHAPTER 7 FUNDAMENTALS OF HARD AND SOFT MEASUREMENT
7.1 INTRODUCTION
7.2 A CHARACTERIZATION OF MEASUREMENT
7.3 A CONCEPTUAL FRAMEWORK OF THE STRUCTURE OF MEASUREMENT
7.4 AN APPLICATION OF THE MEASUREMENT STRUCTURE FRAMEWORK: ASSESSING VERSUS MEASURING RESEARCH QUALITY
7.5 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
NOTES
PART II APPLICATIONS
CHAPTER 8 SYSTEM IDENTIFICATION
8.1 INTRODUCTION
8.2 A FIRST EXAMPLE: THE RESISTIVE DIVIDER
8.3 A FIRST TRIAL OF ESTIMATORS
8.4 FROM TRIAL-AND-ERROR TO A GENERAL FRAMEWORK
8.5 PRACTICAL IDENTIFICATION FRAMEWORK FOR INSTRUMENTATION AND MEASUREMENTS
8.6 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
CHAPTER 9 RELIABILITY MEASUREMENTS
9.1 9.1 INTRODUCTION
9.2 BRIEF REMARKS ON THE CONCEPT OF QUALITY
9.3 RELIABILITY, FAILURE AND FAULT: BASIC CONCEPTS AND DEFINITIONS
9.4 RELIABILITY THEORY
9.5 SYSTEM RELIABILITY ASSESSMENT
9.6 ANALYSIS TECHNIQUES FOR DEPENDABILITY
9.7 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
CHAPTER 10 EMC MEASUREMENTS
10.1 INTRODUCTION
10.2 DEFINITIONS AND TERMINOLOGY
10.3 THE MEASURING RECEIVER
10.4 CONDUCTED EMISSION MEASUREMENTS
10.5 RADIATED EMISSION MEASUREMENTS
10.6 IMMUNITY TESTS
10.7 CONCLUSIONS
FURTHER READING
REFERENCES
EXERCISES
NOTES
PROBLEM SOLUTIONS
SOLUTIONS FOR CHAPTER 1
SOLUTIONS FOR CHAPTER 2
SOLUTIONS FOR CHAPTER 3
SOLUTIONS FOR CHAPTER 4
SOLUTIONS FOR CHAPTER 5
SOLUTIONS FOR CHAPTER 6
SOLUTIONS FOR CHAPTER 7
SOLUTIONS FOR CHAPTER 8
SOLUTIONS FOR CHAPTER 9
SOLUTIONS FOR CHAPTER 10
INDEX
EULA
Chapter 1
Table 1.1
Table 1.2
Chapter 2
Table 2.1
Table 2.2
Table 2.3
Chapter 4
Table 4.1
Chapter 5
Table 5.1
Table 5.2
Chapter 7
Table 7.1
Table 7.2
Table 7.3
Chapter 8
Table 8.1
Chapter 9
Table 9.1
Table 9.2
Table 9.3
Table 9.4
Chapter 10
Table 10.1
Cover
Table of Contents
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There are several books related to instrumentation and measurement that explain how measurement methods work and how instruments can be designed, selected, and used to implement the different measurement methods needed to obtain the desired measurement result with the desired accuracy. But no books are available, to our knowledge, that explain what “measuring” means and which essential activities must be performed to accomplish a measurement.
This is somehow surprising, because measurement has always been an important, and sometimes critical, activity that has developed with the humankind, becoming a significant part of its culture. Today everything is measured, and we are surrounded by instruments, often without being aware of their silent presence. Despite this pervasive presence of every kind of instruments and the many kinds of measurements we perform in our everyday life, measurement is probably the only relevant technical activity that is rarely grounded on a well-defined and widely known models. It is rather considered as a mere tool, not as an independent branch of science and technique, so that it is often confined to the role of appendix, sometimes not so relevant, of other subjects.
This book is aimed at filling this gap, and providing a unique framework, valid for any kind of measurement. So, do not expect too many technical details on how a specific instrument works, or a specific measurement method can be implemented. Many excellent books already cover these topics. Here you will find those fundamental bricks that are present in every modern instrument and are part of every modern measurement activity. You will also discover the importance of some “hidden” bricks, such as the primary standards, without which no universally recognized measurement would be possible.
You will discover the importance of digital signal processing in modern measurements, and how critical it may become if some specific mathematical issues are disregarded. Do not expect to find how modern oscilloscopes or multimeters are designed and developed, since this is the aim of many dedicated books and handbooks. On the contrary, you will find how the aforementioned fundamental bricks can be combined to implement two of the most popular and used instruments.
Most importantly, and maybe surprisingly for those readers who are not yet familiar with this field, you will discover that every measured value is “wrong” in the sense that, due to a number of different factors that influence any measuring activity, we are never able to know the so-called “true value” of the measurand. But you will also discover that we know how to quantify how “wrong” our measurement result is. This is achieved by providing the so-called measurement uncertainty, which tells us how good and reliable the obtained measurement result is. This information is essential when we use a measurement result as the input element of a decision-making process and we wish to quantify the risk of a wrong decision.
To accomplish our goal, we have organized this book into two parts. Part I (Fundamentals) presents a model of the modern measurement activity and the already recalled fundamental bricks. It starts (Chapter 1) with a general model that introduces these bricks and the uncertainty concept, provides an overview of these bricks in the following chapters, and finishes (Chapter 7) with a more general and complex model that encompasses both traditional (hard) measurements and soft measurements, aimed at quantifying nonphysical concepts, such as quality, satisfaction, and comfort.
Part II (Applications) is aimed at showing how the concepts presented in Part I can be usefully applied to design and implement measurements in some very important and broad fields. We cover system identification (Chapter 8), reliability (Chapter 9), and electromagnetic compatibility (EMC) (Chapter 10) not only for their importance in many application areas, from manufacturing to health and safety, but also because their intrinsic complexity is the perfect test bench to prove the usefulness of the concepts introduced in Part I.
We sincerely hope that this book may provide a new, systematic insight into such an important field as instrumentation and measurement, and can help both experts and beginners, with a useful analysis tool, to understand the essential meaning of the measuring activity, regardless of its specific application.
AC
Alternate Current
ACF
Antenna Calibration Factor
ADC
Analog to Digital Converter
AMN
Artificial Mains Network
BAAS
British Association for the Advancement of Science
BCI
Bulk Current Injection
BIPM
Bureau International des Poids et Mesures
BLA
Best Linear Approximation
BW
Bandwidth
CF
Crest Factor
CGPM
Conférence Générale des Poids et Mesures
CIPM
Comité International des Poids et Mesures
CM
Common Mode
CODATA
Committee on Data for Science and Technology
DAC
Digital to Analog Converter
DC
Direct Coupling or Direct Current, depending on the specific context
DFT
Discrete Fourier Transform
DM
Differential Mode
DMM
Digital Multimeter
DNL
Differential Non-linearity
DSP
Digital Signal Processing
DTFT
Discrete-Time Fourier Transform
EFT
Electrical Fast Transient
EM
Electromagnetic
EMC
Electromagnetic Compatibility
EMI
Electromagnetic Interference
EUT
Equipment Under Test
EV
Errors in Variables
FFT
Fast Fourier Transform (algorithm implementation of the DFT)
FIR
Finite Impulse Response (digital filter)
FRF
Frequency Response Function
FSR
Full Scale Range
GUM
Guide to the Expression of Uncertainty in Measurement
I&M
Instrumentation and Measurements
IEC
International Electrotechnical Commission
IEV
International Electrotechnical Vocabulary
IF
Intermediate Frequency
IIR
Infinite Impulse Response (digital filter)
IL
Insertion Loss
INL
Integral Non-linearity
IV
Instrumental Variable
JCGM
Joint Committee for Guides in Metrology
LP
Local Polynomial
LS
Least Squares
LTI
Linear Time Invariant
MA
Moving Average (digital filter)
ML
Maximum Likelihood
NSA
Normalized Site Attenuation
Probability Density Function
PEM
Prediction Error Method
PRBS
Pseudo Random Binary Signal
PUMA
Procedure for Uncertainty Management
PWM
Pulse–Width Modulated
RF
Radio Frequency
RMS
Root Mean Square
SA
Site Attenuation
SFDR
Spurious-Free Dynamic Range
SHA
Sample and Hold Amplifier
SI
Système International d'unités
SINAD
Signal to Noise and Distortion Ratio
SML
Sample Maximum Likelihood
SVSWR
Site Voltage Standing Wave Ratio
THD
Total Harmonic Distortion
UFA
Uniform Field Area
VIM
International Vocabulary of Metrology
VSWR
Voltage Standing Wave Ratio
WCSL
Worst-Case Scalloping Loss
ZOH
Zero-Order Hold
